EMScannerR

Automated Radiated EMI Diagnostic System for PCB-Level Analysis

The Y.I.C. EMScannerR is a high-resolution near-field radiated emission scanning system engineered for EMC engineers and hardware development teams requiring precise PCB-level EMI diagnostics. It provides automated spatial emission mapping to support radiated pre-compliance evaluation prior to accredited chamber testing.

Designed for advanced R&D environments, the system enables quantitative and repeatable analysis of radiated emissions directly at the source.

Measurement Principle

The EMScannerR utilizes a high-density near-field probe array combined with automated X-Y scanning to capture electromagnetic emissions across the PCB surface. The measured near-field data is correlated to radiated emission behavior in accordance with pre-compliance methodologies.

This approach enables:

• Localization of dominant emission sources

• Identification of critical traces, return paths, and high dV/dt nodes

• Analysis of coupling mechanisms

• Early-stage EMI risk assessment

Technical Capabilities

• Automated high-resolution near-field scanning

• Wide frequency coverage suitable for radiated EMI diagnostics

• Peak, quasi-peak and average detection modes (depending on configuration)

• Spectral analysis across user-defined frequency bands

• Comparative analysis between PCB revisions

• Repeatable test positioning and scanning automation

The system supports engineering-level EMI root cause analysis rather than simple pass/fail evaluation.

Advanced Data Visualization

• 2D emission heat maps

• 3D spectral intensity mapping

• Frequency-selective spatial emission visualization

• Delta comparison between design iterations

• Exportable measurement data for documentation and reporting

This allows precise identification of problematic layout regions, shielding weaknesses, and return current discontinuities.

Application Scope

• High-speed digital PCB development

• SMPS and power electronics EMI diagnostics

• Automotive ECU development

• Industrial control systems

• Pre-certification EMC risk mitigation

• Design validation prior to CISPR / FCC chamber testing

Benefits for EMC Engineers

• Reduces dependency on costly chamber pre-tests

• Enables iterative design optimization in-house

• Improves first-pass compliance probability

• Shortens EMC debugging cycles

• Provides objective, repeatable spatial EMI data

The Y.I.C. EMScannerR is a precision diagnostic platform for engineers who require detailed spatial emission analysis and systematic EMI root-cause identification before formal compliance testing.

• Frequency range: 150 kHz – 8 GHz
• Scanning area: L 31.6 cm x W 21.8 cm (L 12.44” x W 8.58”)
• High Resolution: 0.06mm
• 1YR EMViewer Subscription including upgrades, support & hardware warranty.