Y.I.C. Technologies

Near-Field EMI Diagnostic Probe Solution Precision EMI Detection for PCB-Level Troubleshooting The Y.I.C. EMProbe is a professional near-field EMI probe solution designed for fast and accurate detection of electromagnetic emissions directly on PCBs and electronic assemblies. It enables engineers to identify emission sources, analyze coupling paths, and troubleshoot EMI issues during development and validation. Ideal for use with spectrum analyzers, oscilloscopes, or EMI receivers, the EMProbe supports efficient in-house EMI diagnostics before formal compliance testing. Product Highlights High-Sensitivity Near-Field Detection Designed for near-field electromagnetic emission measurements Suitable for radiated EMI source localization High spatial resolution for PCB-level diagnostics Optimized for close-proximity scanning Quickly detect problematic switching nodes, high-speed signal traces, and return path discontinuities. Flexible Diagnostic Applications PCB-level EMI troubleshooting Pre-compliance debugging Power electronics noise analysis High-speed digital system validation Automotive and industrial electronics testing An essential tool for rapid EMI root-cause identification. Compatibility & Integration Compatible with spectrum analyzers Usable with oscilloscopes for time-domain analysis Suitable for EMI receivers Easy integration into laboratory environments Supports both qualitative and quantitative EMI investigations depending on the connected measurement instrument. Key Capabilities at a Glance Near-field electromagnetic emission detection PCB-level hotspot identification Compact and precise probe design Suitable for radiated emission diagnostics Ideal complement to EMI pre-compliance systems Ideal For EMC / EMI engineers PCB design engineers Power electronics developers High-speed digital design teams R&D laboratories Pre-certification EMI troubleshooting The Y.I.C. EMProbe provides a practical and precise solution for identifying and analyzing EMI sources directly at PCB level — helping engineers accelerate debugging and improve EMC performance before formal certification testing. Features: Physical Resolution: 0.2mm Scanning area: 320x250 mm, 180deg Optional Extended Rail – 900x250 mm, 180deg Includes: Main Arm Y.I.C. NFP Set: up to 13GHz probes 1YR EMViewer Subscription including upgrades, support & hardware warranty.

High-Frequency E-Field Near-Field Probe Precision Electric-Field EMI Diagnostics up to 6 GHz The Y.I.C. EMProbe-E6 is a high-frequency near-field probe specifically designed for electric-field (E-field) emission detection in EMI/EMC diagnostics. With frequency coverage up to 6 GHz, it enables engineers to localize high-frequency radiated emission sources directly on PCBs and electronic assemblies. Ideal for high-speed digital systems, RF modules, and fast-switching power electronics, the EMProbe-E6 supports detailed emission analysis during development and pre-compliance troubleshooting. Product Highlights High-Frequency E-Field Detection Optimized for electric-field (E-field) measurements Frequency coverage up to 6 GHz High spatial resolution for precise hotspot localization Designed for close-proximity PCB scanning Perfect for identifying emissions from high-speed traces, connectors, IC pins, and RF components. Advanced EMI Troubleshooting PCB-level radiated emission diagnostics High-speed digital signal analysis RF module evaluation Pre-compliance emission investigation Detection of shielding and layout weaknesses The EMProbe-E6 allows rapid identification of problematic emission zones before formal chamber testing. Compatibility & Integration Compatible with spectrum analyzers Suitable for EMI receivers Usable with oscilloscopes (for time-correlated analysis) Laboratory-ready design Can be integrated into manual diagnostic workflows or used alongside automated EMI scanning systems. Key Capabilities at a Glance Electric-field near-field probe Frequency range up to 6 GHz High-resolution PCB hotspot detection Ideal for RF and high-speed digital diagnostics Compact, precision probe design Ideal For EMC / EMI engineers High-speed PCB designers RF development engineers Automotive electronics teams Industrial electronics developers Advanced R&D laboratories Features: Physical Resolution: ±0.1mm Working Radius: 450mm, J1 (±360°) J2 (±135°) J3 (±154°) J4 (±160°) J5(±173°) J6(±360°) Optional Extended Rail – 1000x450 mm, J1 (±360°) J2 (±135°) J3 (±154°) J4 (±160°) J5(±173°) J6(±360°) Includes: Main Arm Y.I.C. NFP Set: up to 13GHz probes 1YR EMViewer Subscription including upgrades, support & hardware warranty.

Fast and Precise EMI Pre-Compliance Testing for PCB Development The Y.I.C EMScanner is a professional EMI pre-compliance scanning system designed to detect and visualize electromagnetic emissions directly on printed circuit boards (PCBs). It enables engineers to identify noise sources early in the development cycle, significantly reducing time, cost, and risk before formal EMC certification. By combining near-field scanning hardware with powerful analysis software, the EMScanner provides detailed emission mapping and intuitive visualization for fast debugging and optimization. · Frequency range: 150 kHz – 8 GHz · Scanning area: L 31.6 cm x W 21.8 cm (L 12.44” x W 8.58”) · Physical Resolution: 7.5mm · 1YR EMViewer Subscription including upgrades, support & hardware warranty. Product Highlights Near-Field EMI Scanning Technology High-resolution near-field probe array Automated PCB surface scanning Detection of radiated emissions at board level Precise localization of EMI hotspots Identify problematic components, traces, and layouts before final certification testing. Early Pre-Compliance Validation Compare results against regulatory limits Evaluate design changes instantly Reduce risk of EMC test failure Shorten development cycles Ideal for improving first-pass success in accredited EMC laboratories. Advanced Visualization & Analysis Software 2D and 3D emission heat maps Frequency-domain analysis Time-domain signal evaluation Emission comparison between design revisions Automated report generation The intuitive software interface allows fast interpretation of complex EMI behavior. Flexible Integration Suitable for PCB-level testing Compact system footprint Designed for R&D laboratories and development environments Compatible with external spectrum analyzers (depending on configuration) A practical solution for in-house EMI troubleshooting and validation. Key Capabilities at a Glance Automated EMI near-field scanning High spatial resolution mapping Visual emission hotspot identification Pre-compliance validation support Software-based reporting and analysis Ideal For PCB design engineers EMC / EMI specialists R&D laboratories Electronics manufacturers Automotive and industrial electronics development High-speed digital design validation The Y.I.C EMScanner enables engineers to detect, visualize, and resolve EMI issues early in the design process — reducing compliance risk and accelerating product development with confidence.

Advanced PCB EMI Diagnostic System High-Resolution Near-Field EMI Scanning for Professional EMC Development The Y.I.C EMScanner+ is an advanced automated EMI pre-compliance scanning system designed for precise PCB-level radiated emission diagnostics. Building on the EMScanner platform, the EMScanner+ offers enhanced scanning resolution, expanded measurement capability, and improved analysis tools for demanding EMC development environments. It enables engineering teams to detect, localize, and analyze electromagnetic interference early in the design process — significantly improving first-pass success in certified EMC testing laboratories. Product Highlights High-Resolution Automated Near-Field Scanning Dense near-field probe array Automated X-Y PCB scanning High spatial emission resolution Precise EMI hotspot localization Quickly identify emission sources such as high-speed traces, return path discontinuities, switching nodes, and shielding weaknesses. Enhanced Pre-Compliance Capability Radiated emission analysis at PCB level Frequency-selective scanning Comparative design validation Improved correlation to chamber testing The EMScanner+ supports structured EMI debugging and iterative layout optimization before formal certification. Advanced Software & Visualization 2D emission heat maps 3D spectral intensity mapping Frequency-domain analysis Design revision comparison Automated measurement reports Exportable engineering data The intuitive analysis environment allows engineers to move from detection to root-cause identification efficiently. Technical Benefits for EMC Engineers Repeatable and automated scanning process Reduced dependency on external pre-test chambers Faster EMI troubleshooting cycles Quantitative spatial emission data Improved design-for-EMC workflow integration Designed for professional EMC labs and hardware development teams working on high-speed digital and power electronics systems. Key Capabilities at a Glance Automated PCB near-field emission scanning High-resolution emission mapping Pre-compliance reference validation Frequency-domain spectral analysis EMC debugging and documentation tools Ideal For EMC / EMI engineers High-speed PCB development Automotive electronics Industrial control systems Power electronics design R&D laboratories The Y.I.C EMScanner+ provides enhanced spatial emission analysis and professional-grade EMI diagnostics — helping engineering teams reduce compliance risk and accelerate time-to-market through early-stage EMC optimization. High-Speed EMC/EMI Scanner with Internal Spectrum Analyzer Frequency range: 150 kHz – 6 GHz Scanning area: L 31.6 cm x W 21.8 cm (L 12.44” x W 8.58”) Physical Resolution: 7.5mm 1YR EMViewer Subscription including upgrades, support & hardware warranty

Automated Radiated EMI Diagnostic System for PCB-Level Analysis The Y.I.C. EMScannerR is a high-resolution near-field radiated emission scanning system engineered for EMC engineers and hardware development teams requiring precise PCB-level EMI diagnostics. It provides automated spatial emission mapping to support radiated pre-compliance evaluation prior to accredited chamber testing. Designed for advanced R&D environments, the system enables quantitative and repeatable analysis of radiated emissions directly at the source. Measurement Principle The EMScannerR utilizes a high-density near-field probe array combined with automated X-Y scanning to capture electromagnetic emissions across the PCB surface. The measured near-field data is correlated to radiated emission behavior in accordance with pre-compliance methodologies. This approach enables: Localization of dominant emission sources Identification of critical traces, return paths, and high dV/dt nodes Analysis of coupling mechanisms Early-stage EMI risk assessment Technical Capabilities Automated high-resolution near-field scanning Wide frequency coverage suitable for radiated EMI diagnostics Peak, quasi-peak and average detection modes (depending on configuration) Spectral analysis across user-defined frequency bands Comparative analysis between PCB revisions Repeatable test positioning and scanning automation The system supports engineering-level EMI root cause analysis rather than simple pass/fail evaluation. Advanced Data Visualization 2D emission heat maps 3D spectral intensity mapping Frequency-selective spatial emission visualization Delta comparison between design iterations Exportable measurement data for documentation and reporting This allows precise identification of problematic layout regions, shielding weaknesses, and return current discontinuities. Application Scope High-speed digital PCB development SMPS and power electronics EMI diagnostics Automotive ECU development Industrial control systems Pre-certification EMC risk mitigation Design validation prior to CISPR / FCC chamber testing Benefits for EMC Engineers Reduces dependency on costly chamber pre-tests Enables iterative design optimization in-house Improves first-pass compliance probability Shortens EMC debugging cycles Provides objective, repeatable spatial EMI data The Y.I.C. EMScannerR is a precision diagnostic platform for engineers who require detailed spatial emission analysis and systematic EMI root-cause identification before formal compliance testing. Frequency range: 150 kHz – 8 GHzScanning area: L 31.6 cm x W 21.8 cm (L 12.44” x W 8.58”) High Resolution: 0.06mm 1YR EMViewer Subscription including upgrades, support & hardware warranty.

High-Resolution Radiated Emission Diagnostic Platform Advanced Automated PCB Radiated EMI Scanning for Professional EMC Labs The Y.I.C EMScannerR+ is a high-performance automated EMI pre-compliance scanning system engineered for precise PCB-level radiated emission diagnostics. Designed for advanced EMC development and high-speed electronic systems, the EMScannerR+ delivers enhanced spatial resolution, expanded frequency coverage, and improved correlation to formal chamber testing. It enables engineering teams to detect, localize, and quantify EMI sources early in the design cycle — reducing compliance risk and shortening time-to-market. Product Highlights Automated High-Resolution Near-Field Scanning Dense near-field probe array Automated X-Y PCB scanning system High spatial emission resolution Precise radiated EMI hotspot localization Identify emission sources such as high-speed signal lines, switching nodes, return path discontinuities, and shielding weaknesses. Enhanced Radiated Pre-Compliance Capability Frequency-selective emission scanning Radiated emission diagnostics at PCB level Improved correlation to CISPR / FCC chamber measurements Comparative analysis across design revisions The EMScannerR+ supports structured EMI root-cause analysis and systematic EMC optimization. Advanced Software & Analysis Tools 2D and 3D emission heat maps Frequency-domain spectral visualization Peak, average and advanced detection modes Design comparison tools Automated reporting and exportable engineering data The powerful software environment enables detailed emission analysis and professional documentation. Technical Advantages for EMC Engineers Repeatable automated scanning process Reduced dependency on external pre-test facilities Faster EMI troubleshooting and layout optimization Quantitative spatial emission measurement Improved first-pass compliance probability Designed for professional EMC laboratories and advanced hardware development teams. Key Capabilities at a Glance Automated PCB radiated emission scanning High-resolution spatial emission mapping Pre-compliance reference validation Advanced spectral and comparative analysis Engineering-grade reporting tools Ideal For EMC / EMI engineers High-speed digital PCB development Automotive electronics Industrial and power electronics Advanced R&D laboratories Pre-certification EMC validation The Y.I.C EMScannerR+ combines high-resolution near-field scanning with advanced radiated emission analysis — providing a powerful in-house diagnostic solution for professional EMC engineering

Professional EMI Troubleshooting Set Precision Near-Field Detection for EMC Diagnostics The Y.I.C. Near Field Probe Kit is a professional EMI diagnostic solution designed for precise PCB-level emission detection and troubleshooting. It enables engineers to identify and localize electromagnetic interference sources directly on printed circuit boards before formal compliance testing. Engineered for use in R&D labs and EMC environments, the kit supports efficient debugging of radiated emissions in high-speed digital, RF, and power electronic systems. Product Highlights Complete E-Field and H-Field Probe Selection H-field (magnetic field) probes for current loop and switching noise detection E-field (electric field) probes for voltage-driven emission sources Multiple probe geometries for different spatial resolutions Optimized for close-proximity PCB scanning The combination of E-field and H-field probes allows comprehensive EMI source analysis. High-Frequency EMI Diagnostics PCB-level emission localization Switching power supply noise detection High-speed clock and data line investigation RF emission hotspot identification Shielding and grounding validation The probe kit supports systematic EMI root-cause analysis during development. Flexible Laboratory Integration Compatible with spectrum analyzers Suitable for EMI receivers Usable with oscilloscopes for time-domain analysis Ideal complement to Y.I.C. EMScanner systems Provides both qualitative and quantitative EMI diagnostics depending on the connected measurement instrument. Key Capabilities at a Glance Near-field electromagnetic emission detection Electric and magnetic field analysis High spatial resolution PCB scanning Compact and precise probe construction Professional-grade EMC troubleshooting tool Ideal For EMC / EMI engineers PCB design engineers Power electronics developers RF design teams Automotive electronics engineers Research and development laboratories The Y.I.C. Near Field Probe Kit delivers reliable and precise EMI source localization at PCB level — helping engineers accelerate debugging, reduce compliance risk, and improve EMC performance before chamber testing. Set of 5 Electric and Magnetic probes, 5-50mm USB Camera and mechanical arm. HXY 10A02: 10 MHz – 350 MHz HXY 20A02: 100 MHz – 1.4 GHz HZ 40A02: 1 GHz – 14 GHz HXY 60A01: 1 GHz – 13 GHz E 00A02: 1.6 GHz – 18 GHz USB 5MP x10 Optical Zoom Camera 1YR EMViewer Subscription including upgrades, support & hardware warranty.